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Follow on Google News | Axiom Test Equipment Blog – Get a Charge Out of Device Capacitance-Voltage TestingC-V device testing involves measuring the current through a device under test (DUT) and the voltage across its junction and using the amplitude of the impedance (Z) and the phase angle between the current and the voltage. C-V measurements are often performed on a DUT which is part of a semiconductor wafer, requiring the use of a pair of well-grounded probes. Read the blog post to learn what to look for when selecting test equipment for semiconductor device C-V measurements as several performance parameters can be used for comparison purposes. Some broad level aspects that matter include the capacitance measurement range of the test equipment and the capacitance measurement resolution and accuracy. Since measurement accuracy is a function of frequency, the accuracy of test equipment at a test frequency should also be considered when selecting C-V test gear for an application, especially when measurements are to be made at higher frequencies. Learn additional details about Capacitance- Rent or purchase quality test equipment from Axiom Test Equipment - your source for electronic test and measurement equipment. Axiom rents, sells, repairs and accepts trade-in of test equipment to support your specific test & measurement needs. If you would like help selecting any type of test equipment for your project, contact Axiom Test Equipment's sales department at sales@axiomtest.com, call 760-806-6600, or browse Axiom Test Equipment's inventory online at www.axiomtest.com. End
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