Centellax Webcast on Optimizing Parallel Jitter Tolerance in Multi-Channel Devices

Santa Rosa, Calif., April 8, 2011 - Centellax announced today they will be partnering with EDN for a live webcast on optimizing parallel jitter tolerance measurements in multi-lane channels and devices with multiple SERDES.
 
April 21, 2011 - PRLog -- This webcast will explain jitter tolerance testing in depth, with special emphasis on strategies for testing multiple lanes or devices in parallel.  In addition, it also clarifies poorly understood concepts such as limit versus margin testing, dwell and recovery time, and the different search algorithms and their impact on repeatability.

“After the extreme success of our Crosstalk webcast last November, in both the USA and China,  it was clear that our customers are interested in learning more about what Centellax has to offer,” states Steve Sekel, VP of Product Management at Centellax. Steve Sekel continues “Centellax has a lot of exciting new products and software. Our innovative solutions encompass leading edge technology and are still very affordable.”

The live webcast will be held on April 20, 2011 from 11:00am to 1:00pm PST. The on-demand presentation will be available at the end of April at www.centellax.com. The webcast will be presented by William Sitch, Director of Test Solutions for Centellax, Inc.
For more information on JTOL visit: http://www.centellax.com/applications/jtol.

Centellax will also be offering the same webcast in Chinese through their China office in late May.  Details of this webcast will be available at the end of April at www.centellax.com.

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Established in 2001, Centellax delivers low-cost, high-performance test instruments, test accessories and electrical components for high speed communications and signal integrity applications. Corporate headquarters is located in Santa Rosa, CA.
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