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Xiris Releases Machine Vision System for Solar Cell and Wafer Inspection
PVCI-1500 Machine Vision Platform for Crystalline Silicon Inspection
Using a combination of visible and non-visible illumination sources and a unique single optical path, dual camera system, the PVCI-1500 can be configured for many common inspection requirements including crack detection, edge defect detection, surface inspection, print inspection, color binning and color homogeneity.
The PVCI-1500 is initially offered in two variants; a low cost configuration with high powered back illumination, front illumination and a high resolution monochrome camera targeting incoming cell inspection for module manufacturers and a feature rich version which adds multi-angle front illumination and an accurate color camera to support cell classification.
For More Information Visit http://www.xiris.com
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Since its founding in 1989, Xiris has grown steadily, building knowledge and expertise in Machine Vision systems by creating standard products for a variety of industries. By 2009, Xiris had delivered over 1500 inspection systems to more than 30 countries around the world inspecting over 25 million products per day, becoming the leading inspection systems provider for several select markets while continuing to diversify into new markets such as solar, metal fabrication and semiconductor
Page Updated Last on: Mar 02, 2010