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Follow on Google News | Keithley Parametric Curve Tracer Honored as a 2012 “Product of the Year”Keithley Instruments, Inc., announced today that the editors of Electronic Products magazine have honored the company’s new Parametric Curve Tracer (PCT) Configurations as a “Product of the Year” award winner for 2012.
Prior to its selection as a “Product of the Year,” the PCT Configurations were profiled in October 2012 in Electronic Products. Editor Richard Comerford outlined the differences between traditional (and now obsolete) curve tracers and the new capabilities the PCT Configurations provide in an article titled “The instrument that wouldn’t die!” He described the PCT Configurations as a combination of “the range and simplicity of a curve tracer with the flexibility and precision of a parameter analyzer.” He went on to note, “I had a lot of fun playing with the new tracer/analyzer, even though it was in a lab in Ohio and I was sitting at my desk in New York—which is something I never was able to do with a curve tracer before. It was like having an old friend who’d come back from the grave, only better than when he’d left.” Seven different PCT instrumentation, software, and test fixture configurations are optimized for characterizing high power devices at up to 3,000V and 100A. They provide the industry's most cost-effective solution for characterizing the growing number of high power semiconductor devices, including those based on silicon carbide (SiC) and gallium nitride (GaN) technology. These systems offer the power required for the vast majority of high power device design and development applications, and are optimized to address the characterization and test needs of research, reliability, failure analysis, and power device applications engineers; power device designers; incoming inspection technicians; These systems offer the flexibility to add new measurement channels economically as users' needs evolve, with no need to return the system to the factory to install new hardware. Six different Keithley System SourceMeter® All systems include the latest version of Keithley's ACS (Automated Characterization Suite) Basic Edition software, which supports Keithley's newest SMU instruments and takes maximum advantage of the Series 2600B's TSP-Link connection trigger model, which allows for 500ns trigger synchronization between instruments. This tighter synchronization capability maximizes the high speed pulse mode capabilities of Keithley’s Model 2651A and Model 2657A High Power System SourceMeter instruments. The Windows-compatible ACS Basic Edition package provides control and analysis tools well-suited for high power device characterization, including complete parametric test libraries for MOSFETs, BJTs, triacs, diodes, IGBTs, and other device types. The software's "trace" mode, which uses an on-screen slider control that works much like the power control knob on a traditional analog curve tracer, allows users to control the level of voltage and current levels sourced interactively and to see how the power device responds in real time. The software's "parametric" For More Information Additional information on the Parametric Curve Tracer Configurations is available on Keithley’s website at http://www.keithley.com/ Telephone: 888-534-8453 440-248-0400 FAX: 440-248-6168 E-mail: publisher@keithley.com Internet: www.keithley.com Address: Keithley Instruments, Inc. 28775 Aurora Road Cleveland, OH 44139-1891 About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio. End
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