Worlds First 3D Universal Surface Profilometer

Jan. 5, 2011 - PRLog -- AEP Techology, a Silicon Valley High tech manufacturer announces - NanoMap-D, Worlds First, next- generation advanced 3D Universal Surface Profilometer which can accommodate BOTH 3D optical surface profilometer and 3D scanning contact profilometer on same tester. Both complementing techniques on same platform opens the window to analyze any kind of sample with ease and reliability. Automatic ease of switching both heads and easy software makes this system very potent and versatile.

In addition to being so versatile and easy to use, NanoMap-D generates 2 million pixel + image with sub nm resolution. This tester is primarily used to calculate surface roughness, defects, volume wear, surface profile, film thickness, step height, film stress et

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AEP 3D surface profilometers (contact and non contact profilers) excel in innovation, ease of use and precision. They generate more than 2 million pixel image with picometer (0.001nm) resolution.