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October 2021
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By PADT, Inc
PADT is Now Selling the Three Leading GOM and ZEISS Optical and Laser Scanning Systems Throughout the Mountain and Southwest States
By k-Space Associates, Inc.
System Will Detect Color Defects Early in Glass and Solar Industries
By k-Space Associates, Inc.
k-Space Associates, Inc. is excited to announce the release of kSA SpectR, a complete non-contact metrology solution for measuring absolute spectral reflectance, L*a*b* color parameters, and growth rate.
By Sensory Analytics
Sensory's latest patent will further expand its intellectual property portfolio for coating and layer thickness measurement into the European Union
By k-Space Associates, Inc.
k-Space Associates, Inc., a leading thin-film metrology manufacturer, received a multi-system order from Veeco Instruments, Inc.
By The Information Network
KLA was the only major semiconductor/metrology equipment company to exhibit positive growth in 2019, according to the report "Metrology, Inspection, and Process Control in VLSI Manufacturing," recently published by The Information Network,...
By k-Space Associates, Inc.
k-Space Associates, Inc. broke ground for the construction of its second building, which will be located next to k-Space's current headquarters in the Dexter Business and Research Park in Dexter, MI.

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