Axiom Test Equipment – Blog: Semiconductor Measurements Characterize Devices and Materials

VISTA, Calif. - April 4, 2022 - PRLog -- Axiom Test Equipment, an electronic test equipment rental and sales company has published a new blog post that informs people on how semiconductor testing can be conducted. Semiconductors are essential to modern electronics and can be found in almost all electrical products throughout many industries. They come in many forms, with diodes, optocouplers, rectifiers, and transistors among discrete devices. Because semiconductor testing covers such a variety of devices under test (DUTs), it involves many different measurements and, depending on the DUT, often many different test units to perform the measurements.

Gaining a better understanding of a semiconductor or the material it is fabricated on requires evaluating it under different operating conditions, such as different voltage (V), current (I), and power levels. In some cases, testing is performed to find a semiconductor's safe operating levels as well as its stress levels, where it begins to suffer degraded performance.

Semiconductor testing can involve many different types of measurements to characterize a complex IC or the wafer upon which it is fabricated, but for characterizing a simpler device such as a diode, testing starts with a basic semiconductor parameter analyzer capable of tracking I and V responses, such as the Keysight 4155C Semiconductor Parameter Analyzer.

Learn more about which Semiconductor best fits your needs by reading the full blog post on Axiom's website:

Whatever your project requires testing of, rent or buy quality test equipment from Axiom Test Equipment. For over 15 years Axiom Test Equipment has rented, sold, repaired and accepted trade-in of test equipment to support your test & measurement needs. If you would like help selecting any type of test equipment for your next project, contact Axiom Test Equipment's sales department at, call 760-806-6600, or browse Axiom Test Equipment's inventory online at

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