Joseph Federico of NJ MET to Present Issues in Solvent Testing for Counterfeits at Electronica 2014

Joseph Federico will be presenting a talk on "Issues in Solvent Testing for Counterfeits" at Electronica 2014. The article was published by US Tech. Mr. Federico’s talk will take place at 2 PM daily in the NJ MET booth in Hall A6, Booth 577.
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* Njmet
* Joseph Federico
* Electronica
* US Tech
* Counterfeit Component Testing

* Defense
* Electronics

* Clifton - New Jersey - US

CLIFTON, N.J. - Nov. 10, 2014 - PRLog -- Joseph Federico, VP and Director of NJ MET, will give a presentation based on his recent article Issues in Solvent Testing for Counterfeits, that was published in the October, 2014 issue of US Tech.  Mr. Federico will speak at the electronic testing exhibition at the 26th International Trade Fair for Electronics Components, Systems and Applications -- Electronica 2014 -- at Messe Munchen in Munich, Germany, Hall A6, Booth 577.  His talk will be held each afternoon of the conference, November 11-14, at 2 PM.

The article describes the proper procedures for solvent testing for remarked and resurfaced electronic components and the occurrence of false positive results when a solvent test is applied to the wrong type of electronic component.

Electronica is considered the electronics world's leading trade fair. It is the largest in the electronics industry and is held once every two years. “This is the perfect forum to address to correctly applying the appropriate solvent testing procedures to prevent the occurrences of rejecting authentic devices,” said Joseph Federico from NJ MET company headquarters in NJ.  “I will be giving a short presentation and addressing thorough testing with the appropriate procedures necessary to identify counterfeit components and keep them out of the supply chain.”

Please stop by the NJ MET booth at Electronica, Hall A6, Booth 577 and learn about NJ MET's latest developments in component testing. Watch their laboratory video at

For more information on all of NJ MET’s electronic component testing capabilities including the Mission Imposter® Risk Mitigation Counterfeit Detection program, please contact Joseph Federico at NJ MET’s Electronica 2014 booth, or visit the NJ MET website at

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