Image Metrology A/S Announces the Launch of topoStitch™

COPENHAGEN, Denmark - May 22, 2013 - PRLog -- Often a single image with a limited field of view is not enough to reliably evaluate a nano- or microscale surface. With topoStitch™ any researcher is now able to create accurate stitches of multiple topographic images from their AFMs, SPMs, profilers, interferometers, and confocal microscopes with just a few mouse clicks.

“We have received many requests for an image stitching program from researchers all over the world”, says Dr. Jan F. Jorgensen, founder and CEO of Image Metrology A/S. “We therefore decided to use our expertise to meet the demand by creating an easy-to-use software program able to handle a large amount of images and perform stitch positioning down at the sub-pixel level.”

A free evaluation version of topoStitch™ is available for download at www.topostitch.com.

Image Metrology A/S is a worldwide leading supplier of image processing software for "nano-microscopy". Image Metrology A/S is best known for the software program, SPIP™, which has become the global de-facto standard for nano- and microscale image processing among high-tech companies and leading research institutes.

If you would like more information about topoStitch™, or to schedule an interview with Dr. Jan F. Jorgensen, please call Heini L. Hansen at +45 – 469 234 00 or send an email to info@imagemet.com.

Photo:
https://www.prlog.org/12142495/2