Experience opto-digital microscopy at EUSPEN

May 15, 2013 - PRLog -- Olympus will present its expanded range of opto-digital microscopy systems at the EUSPEN conference (May 27-30, Berlin, booth 23 + 31). The company will showcase the brand new LEXT OLS4100 laser scanning microscope and two microscopes from the award-winning opto-digital DSX series – the DSX 500 and DSX 100. All systems at the conference will be fully operational, and Olympus welcomes attendees to bring their own samples and test the microscopes.

In addition, the conference will mark the start of the Olympus ‘Opto-Digital Microscopy Applications Sponsorship (http://www.inspect-online.com/olympus/)’, in co-operation with ‘inspect magazine’. The programme invites applicants to submit short, innovative proposals for precision engineering and materials science projects requiring the LEXT OLS4100, DSX 500 or DSX100 systems. Chosen applicants will have free use of the corresponding opto-digital microscope for three to six months at their own facility, including full set-up and support. Entries will be judged by delegates from Olympus, ‘inspect magazine’ and independent researchers, Prof Richard Leach, at the National Physical Laboratory UK and Dr. Oltmann Riemer, at the University of Bremen, Laboratory of Precision Machining.

The Olympus opto-digital range has been designed to combine ergonomics with advanced optics and high precision for non-contact, non-destructive metrology measurements. The new LEXT OLS4100 3D measurement laser scanning microscope for surface metrology has been improved to enhance performance and ease of operation. New features include an ultra-fast mode for measuring micro-samples with very steep angles, and a multi-layer mode to facilitate observation and measurement of transparent samples.

Suitable for the inspection of a large range of sample types, sizes and weights, the DSX systems feature touch screen control and on screen visualisation, in place of eye-pieces. The systems can automatically generate a selection of previews for each imaging technique, allowing the user to quickly select the best imaging approach, significantly aiding efficiency and speed. The Olympus DSX opto-digital microscope series recently received a gold trophy at the esteemed iF Design Awards, in recognition of its design, precision and intuitive use.

Visit us at booth 23 + 31 to test our expanded opto-digital range and to find out how to apply for the Opto-Digital Microscopy Applications Sponsorship at: www.inspect-online.com/olympus.

For further information on the EUSPEN conference go to http://www.berlin2013.euspen.eu, and to find out more about the Olympus opto-digital range please visit http://www.olympus-ims.com/en/metrology/