New X-Strata920 from Oxford Instruments for rapid and reliable XRF coating thickness measurement

New X-Strata920 from Oxford Instruments offers rapid and reliable XRF coating thickness measurement and materials analysis, combining sleek new design with improved stability and reliability, making a truly cost effective package.
X-Strata920 Coating thickness analyser
X-Strata920 Coating thickness analyser
April 17, 2012 - PRLog -- New X-Strata920 from Oxford Instruments offers rapid and reliable XRF coating thickness measurement and materials analysis, combining sleek new design with improved stability and reliability, making a truly cost effective package.

-   Improved stability and reliability
-   Enhanced performance
-   Compliant with safety and security requirements
-   New ergonomic sleeker design
-   Easy to use and fast to learn

Oxford Instruments is pleased to announce the new X-Strata920 X-ray fluorescence (XRF) analyser for coating thickness measurement and materials analysis. It combines a large area proportional detector and Oxford Instruments’ micro-focus X-ray tube, providing a high-intensity, small spot X-ray beam for superior sample excitation. This combination guarantees the best accuracy in its class, with analysis results obtained in seconds to ensure better process control and cost efficiency.

So whether you analyse solder alloys as part of your quality control process, or assay gold jewellery for valuation, or plating thickness in component manufacture, we believe the X-Strata920 is an ideal solution for your business, providing reliable analysis you need at a price you’ll like.

X-Strata920 performs excellent analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay. For these industries, the X-Strata920 offers a number of benefits:

- Increase productivity with better process control
- Minimise production cost vqzai of the plating process and maximise production output
- Rapid, non-destructive analysis of jewellery and other alloys
- Rapid analysis of up to 4 coating layers
- Field-proven technology and better reliability ensuring value for money year after year
- Easy to use, with minimal user training required

The X-Strata920 is designed with ease of use, accuracy and value for money in mind. A large sample area can be analysed in one measurement cycle using the X-Strata’s multi-point analysis function. If a problem area is identified the operator can return to specific points with pin point accuracy for detailed investigation. With the analyser’s embedded camera and live video imaging, precise sample placement is assured. The X-Strata920 even allows unattended operation to ensure minimal downtimes of your production process.

The X-Strata920 comes with a choice of calibration packages tailored for a wide range of materials screening applications; the analyser is supplied with over 800 pre-loaded, easy-to-select application parameters/methods.
To build consumer confidence the X-Strata920 meets international test methods such as ASTM B568 and ISO 3497.

With its advanced security and safety features, the X-Strata920 provides a simple user interface for the routine operator whilst assuring manager level access for system set up and preventing unauthorised use through its auto lock function. The improved reporting function allows seamless export to Excel within seconds and export in custom reports, including statistical data analysis and sampling images.

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Oxford Instruments designs, supplies and supports high-technology tools and systems with a focus on research and industrial applications. It provides solutions needed to advance fundamental physics research and its transfer into commercial nanotechnology applications. Innovation has been the driving force behind Oxford Instruments' growth and success for over 50 years, and its strategy is to effect the successful commercialisation of these ideas by bringing them to market in a timely and customer-focused fashion.
Oxford Instruments, Industrial Analysis offers a range of analytical instruments designed for demanding quality control applications. From materials analysis to thickness gauging, the Industrial Analysis products incorporate the latest field proven technology, coupled with over 30 years of experience in designing, producing and supporting world class instruments.
Source:Oxford Instruments Industrial Analysis
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Phone:+44 (0) 1494 479278
Zip:HP12 3SE
Tags:Coating Thickness Testing, Materials Analysis, XRF Analyser, Quality Control, Multi-layer Analysis
Industry:Electronics, Jewelry, Technology
Location:High Wycombe - Buckinghamshire - England
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