Follow on Google News News By Tag * Electrical Test * high brightness LEDs * Current Source * Pulse Generator * Semiconductor Test * Nanotechnology * More Tags... Industry News News By Place Country(s) Industry News
Follow on Google News | Keithley Introduces System SourceMeter® Instrument Optimized for High Power Semiconductor TestKeithley Instruments today introduced the Model 2651A High Power System SourceMeter® instrument, the latest addition to the company’s Series 2600A System SourceMeter family.
By: Keithley Instruments Inc. Like each member of the Series 2600A family, the Model 2651A offers a highly flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It combines the functionality of multiple instruments in a single full-rack enclosure: semiconductor characterization instrument, precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load, and trigger controller, and is fully expandable into a multi-channel, tightly synchronized system via Keithley’s TSP-Link® technology. Unlike competitive solutions, which typically have limited power, measurement speed, and/or resolution, the Model 2651A can source or sink up to 2,000W of pulsed power (±40V, ±50A) or 200W of DC power (±10V@±20A, ±20V@±10A, ±40V@±5A). It can also make precise measurements of signals as low as 1pA and 100 microvolts at speeds up to one microsecond per reading. Two Measurement Modes: Digitizing or Integrating The Model 2651A provides a choice of digitizing or integrating measurement modes for precise characterization of both transient and steady-state behavior. Two independent analog-to-digital (A/D) converters define each mode—one for current and the other for voltage—which run simultaneously for accurate source readback without sacrificing test throughput. The digitizing measurement mode’s 18-bit A/D converters allow capturing up to one million readings per second for continuous one-microsecond- The integrating measurement mode, based on 22-bit A/D converters, optimizes the instrument’s operation for applications that demand the highest possible measurement accuracy and resolution. This ensures precise measurements of the very low currents and voltages common in next-generation devices. All Series 2600A instruments provide integrating measurement mode operation. Wide Dynamic Range Addresses a Broader Range of Applications Connecting two Model 2651A units in parallel via TSP-Link expands the system’s current range from 50A to 100A. This is two-and-one- • Power semiconductor, HBLED, and optical device characterization and testing • Characterization of GaN, SiC, and other compound materials and devices • Semiconductor junction temperature characterization • Reliability testing • High speed, high precision digitization • Electromigration studies High Speed Pulsing Prevents Device Self-Heating During Test To minimize device self-heating during tests, a common problem with high power semiconductors and materials, the Model 2651A offers high speed pulsing capabilities that allow users to source and measure pulses with high accuracy. Pulse widths from 100 microseconds to DC and duty cycles from 1 percent to 100 percent are programmable. Competing solutions are typically hampered by limited flexibility for programming the instrumentation’ Powerful Test Script Development Tools TSP Express, Keithley’s LXI-based I-V test software utility, is embedded in the instrument, so there’s no need for software installation or programming. From basic to advanced tests, TSP Express delivers device data in three easy steps: connect, configure, and collect. It also simplifies connecting instruments to allow higher pulsing levels. Results can be viewed in either graphical or tabular format and then exported to a .csv file for use with spreadsheet applications. Two other powerful software tools for creating test sequences are also provided. The Test Script Builder application supports creating, modifying, debugging, running, and managing TSP scripts. An IVI-based LabVIEW® driver simplifies integrating the Model 2651A into LabVIEW test sequences. Availability Effective April 2011, delivery is eight weeks after receipt of order. For More Information To learn more, visit the Model 2651A product page: http://www.keithley.com/ Telephone: FAX: 440-248- E-mail: Internet: Address: 28775 Aurora Road Cleveland, OH 44139-1891 About Keithley Instruments, Inc. With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio. Products and company names listed are trademarks or trade names of their respective companies. # # # About Keithley Instruments Inc.: With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems. Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test. In 2010, Keithley Instruments joined Tektronix as part of its test and measurement portfolio. Learn more at http://www.keithley.com End
Account Email Address Account Phone Number Disclaimer Report Abuse
|
|