Frost & Sullivan Hosts Free Webinar with Agilent Technologies Inc.

Jan. 31, 2011 - PRLog -- Contact:
Sarah Saatzer
Frost & Sullivan               
+1.210.477.8427               
sarah.saatzer@frost.com

MOUNTAIN VIEW, CA

WHEN:      Tuesday, Feb. 22, 2011 at 1 p.m. EST
LOCATION:   Online, with free registration
SPEAKERS:    Mariano Kimbara, Research Analyst for Frost & Sullivan’s Measurement & Instrumentation group and Bill Lycette, Manager, Corporate Quality, Agilent Technologies Inc.

Recent research performed on the general purpose test equipment market has shown increased interest from end users in lowering their cost of test. While economic conditions are improving, the downturn has changed companies’ behavior forever and their focus on lowering the cost of test is expected to remain strong.

Achieving a lower cost of test requires a thorough understanding of total cost of ownership. This briefing will present key findings from research recently performed on the general purpose test & measurement equipment market and highlight the challenges faced by end users of general purpose test equipment.

Frost & Sullivan has invited Bill Lycette, Manager of Corporate Quality at Agilent Technologies and author of several whitepapers on the subject to comment on models to best calculate cost of ownership. With his colleague Duane Lowenstein, Mr. Lycette received the David M. Goodman Best Paper Award for Management Topics at Autotestcon 2010 for their insightful examination of total cost of ownership for test equipment.

This briefing will benefit end users of general purpose test & measurement equipment such as oscilloscopes, signal generators, spectrum analyzers, network analyzers, logic analyzers, power meters, electronic counters and multimeters, as well as manufacturers of such equipment by discussing the current market dynamics, providing revenue forecasts, identifying key industry challenges and highlighting current & future solutions for tackling one key market issue – lowering the cost of test.



Supporting Quotes
“The cost of test for general purpose test equipment is not just about the initial capital price,” observes Frost & Sullivan Research Analyst Mariano Kimbara. “Calibration, maintenance, personnel required to support the test systems, etc. are all aspects that need to be taken into consideration when making a purchase decision. While understanding the total cost of ownership of test equipment over the entire product lifecycle is critical to lowering the cost of test, it remains a daunting task for end users and requires the use of sophisticated models.”

“The costs to own and operate test & measurement equipment over its useful life can easily exceed the purchase price of the equipment,” states Agilent Technologies Corporate Quality Manager Bill Lycette. “Identifying and understanding critical ownership factors through total cost of ownership modeling is an important step towards improving the bottom line of the enterprise.”

Supporting Resources
For more information about Frost & Sullivan’s Measurement & Instrumentation practice, please visit: http://www.frost.com/M&I

Registration
•   To attend the briefing, email sarah.saatzer@frost.com your full name, job title, company name, company telephone number, company email address and web site, city, state and country.
•   Receive a recorded version of the briefing anytime by submitting the aforementioned contact details.

About Frost & Sullivan
Frost & Sullivan, the Growth Partnership Company, enables clients to accelerate growth and achieve best-in-class positions in growth, innovation and leadership. The company's Growth Partnership Service provides the CEO and the CEO's Growth Team with disciplined research and best-practice models to drive the generation, evaluation, and implementation of powerful growth strategies. Frost & Sullivan leverages over 50 years of experience in partnering with Global 1000 companies, emerging businesses and the investment community from 40 offices on six continents. To join our Growth Partnership, please visit http://www.frost.com.