k-Space Thin-Film Metrology Tools Improve Solar Panel Production Efficiency and Quality

DEXTER, Mich. - Jan. 22, 2015 - PRLog -- k-Space Associates, Inc. is supplying thin-film metrology tools to the photovoltaic industry in an effort to improve efficiency and reliability of solar panel technologies. Building on their presence in the crystalline III-V multi-junction solar cell market, k-Space now has over 100 tools in operation in commercial in-line photovoltaics production facilities around the world. These in-line tools are monitoring both process and material quality parameters and providing real-time feedback for process control.

k-Space PV metrology tools are tailored to measure the unique material properties and production processes of thin film solar technologies, such as CdTe and CIGS. Absorption edge, film thickness, panel temperature, surface roughness, and absolute spectral reflectance during solar panel production are some of the parameters monitored.

“There is a need for improved in-line, real-time metrology during solar panel production. Starting in 2011, we adapted our semiconductor wafer-based metrology tools to thin-film solar panel manufacturing, as semiconductor materials are used in both processes. By measuring and storing data for each panel during production, our customers are not only able to make real-time adjustments to their process, but they also have access to data that can enable further product and process development. We look forward to continuing to supply solar manufacturers with their in-line metrology needs,” commented Darryl Barlett, CEO of k-Space Associates, Inc.

Recognizing the need for metrology tools in photovoltaics production, k-Space has staff with extensive experience in photovoltaics research and manufacturing. Greg DeMaggio, product development engineer for k-Space, said, “My experience in photovoltaic production over the past 20 years has shown that inserting in-line metrology and diagnostics tools has been the most effective means of improving efficiency and yield. Optimization of process requires fast, reliable feedback.”

To learn more about the k-Space line of thin-film metrology tools, visit www.k-space.com.