AXT and TESCAN Sponsor Joint Microscopy, Microanalysis and Nanotechnology Conference

AXT and TESCAN will be sponsoring the upcoming ACMM23/ICONN2014 conference on microscopy, microanalysis and nanotechnology. At the tradeshow they will have a high-performance LYRA FIB-FESEM available for private demonstrations and workshops.
 
 
The TESCAN LYRA featuring a high performance FIB and high resolution FEG-SEM.
The TESCAN LYRA featuring a high performance FIB and high resolution FEG-SEM.
WARRIEWOOD, Australia - Dec. 22, 2013 - PRLog -- AXT Pty Ltd, a leading supplier of microscopes and microscopy-related equipment are proud to announce that they, and their major supplier TESCAN will both be gold sponsors at the upcoming ACMM23/ICONN2014 conference (http://www.aomevents.com/ACMMICONN). The event will take place in in Adelaide from February 2 to 6, 2014.

Those with high-end SEM requirements will be pleased to know that TESCAN will be sending out a LYRA FIB-FESEM that combines a high-performance FIB with a high-resolution FEG-SEM column. This combination creates Am extremely powerful instrument for high-resolution imaging/analysis and milling/deposition. Simultaneous SEM imaging and FIB etching or deposition is unprecedentedly easy and enjoyable, with the added possibility of high precision nano/micro machining and ion beam lithography. TESCAN’s fully integrated CAD-like multilayer editor (DrawBeam) is able to generate the most complex patterns with each layer using its own distinct parameters (e.g. beam current, dwell time, spacing, etc.).

Equipped with a host of detectors including SE, BSE, InBeam SE and BSE (for high resolution imaging), colour CL (cathodoluminescence), beam deceleration technology (low voltage imaging) TOF-SIMS, SITD (secondary ion detector), STEM and LVSTD (low vacuum SE detector), nano-manipulator, GIS (Gas Injection System) with 5 gases, the LYRA becomes a super- analytical instrument providing valuable insights into the micro and nano world.

Also on show at this event will be the TESCAN Integrated Minerals Analyzer (TIMA), a system that has been specifically designed to satisfy the needs of the mining and minerals processing industry. With fully integrated EDX systems, the TIMA provides fast, accurate and fully automated data acquisition and analysis of minerals.

Both of the TESCAN scanning electron microscopes will be available for personalised demonstrations at ACMM23/ICONN2014. Interested parties should contact media@axt.com.au to register their interest or book an appointment.

AXT will also be showcasing other product lines including the Hirox 3D digital microscope, Fischione range of ion mills, sample preparation equipment, specimen tomography holders and imaging detectors and another exciting product that has yet to be released onto the worldwide market.

For more information on the AXT’s product range please visit www.axt.com.au  or stop by booths 57 to 60 at ACMM23/ICONN2014.

Contact
Cameron Chai
***@axt.com.au
02 8188 0298
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Tags:Tescan, Sem, FIB-FESEM, Electron Microscope, Nanotechnology
Industry:Science, Technology
Location:Warriewood - New South Wales - Australia
Subject:Partnerships
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