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Antiques analysis roadshow pleases visitors at the Oxford Open Days

As part of the Oxford Open Doors weekend coordinated of the 8-9 September, Oxford Instruments displayed its X-ray Fluorescence (XRF) analyser providing visitors an opportunity to have their antiques and objects of interest analysed in front of them.

 
PRLog - Sep. 17, 2012 - As part of the Oxford Open Doors weekend coordinated by the Oxford Preservation Society over the weekend of the 8th-9th September, Oxford Instruments displayed its X-ray Fluorescence (XRF) analyser at the Ashmolean Museum providing visitors an opportunity to have their antiques and objects of interest analysed in front of them.

Oxford Instruments showed that XRF analysis is a fast, simple and non-destructive technique to identify what exactly something is made of. Visitors brought along various objects from 1200 year old bells found in their gardens, jewellery that could be traced to different parts of the globe from its elemental composition, to 18th century photographs taken using now redundant Platinum and Palladium techniques. Clear analytical evidence of the process of manufacture was provided by the X-Strata980 and with the on hand knowledge of historic curators, life was given to some of these neglected artefacts from lofts and attics across Oxfordshire.

Interest in this event was very high and the team of Oxford Instruments was busy analysing a range of pieces all day. “The visitors didn’t disappoint with the variety of objects brought to us on the day. There were numerous stories and we hope that the use of the X-Strata980 cleared up some disputes and informed others of the origins of their objects. The use of the Karat analysis tool that can also quantify the exact Karat composition of Gold was also a great talking point and left some very pleased and some not so pleased individuals!” said XRF Applications Leader, Judith Bain.

Oxford Instruments XRF analysers measure coating thickness and material composition of plating, coatings, and thin films, containing elements from Titanium through Uranium. The instruments measure five layers and fifteen elements of a sample with common element correction.  The X-Strata performs excellent analysis and characterisation of multi-layer analysis across a wide range of industrial markets, including electronics, metal finishing, alloys and precious metals assay.

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Contact Email:
***@oxinst.com Email Verified
Source:Oxford Instruments
Phone:01494 442255
Zip:HP12 3SE
City/Town:High Wycombe - Buckinghamshire - United Kingdom
Industry:Antiques, Arts
Tags:antiques, Arts, analysis, xrf
Shortcut:prlog.org/11976674
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