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Chroma ATE Unveils 58173-V Laser Diode Test System

Chroma ATE has introduced its new Chroma 58173-V Laser Diode Test System, providing a total solution for VCSEL production lines from wafer to final package. The system is being unveiled this week at SPIE Photonics West in San Francisco, California.

 
 
Chroma 58173-V Laser Diode Test System
Chroma 58173-V Laser Diode Test System
PRLog - Jan. 24, 2012 - IRVINE, Calif. -- Chroma ATE, a world leading supplier of electronic test, measurement, and manufacturing equipment, has unveiled its new Chroma 58173-V Laser Diode Test System at SPIE Photonics West in San Francisco, CA this week. The Chroma 58173-V Laser Diode test system provides a total solution for VCSEL production lines from wafer to final package and is accurate enough to be used in research & development and QA environments for device characterization and validation.  Key features of the system include fine resolution CCD scanner with precision wafer mapping, high-speed automated prober, a temperature controlled chuck, and a wide spectral range for both power and wavelength measurement.

The Chroma 58173-V Laser Diode test system is compatible with wafer, die, chips and numerous package types including TO-Can and LCC. The system’s highly compact design is a result of Chroma’s history of research and engineering experience with semiconductor and LED solutions. It offers precision testing on a stable platform with intuitive functionality & operation.  Solution flexibility allows for adaptation to differing laser diode applications.

Chroma 58173-V system is suitable for wide range of wavelengths from visible to long wavelength (500~1600 nm) by selecting the respective optical module & software settings. Using an integrated sphere along with solid test methodology, the system gathers the necessary data from the VCSEL under test including LIV sweeps, threshold current, spectrum characteristics & defect curve.

A thermal chuck & packaged device holder allow for wafer, die, or chip testing in various temperature conditions and yields correlation between wafer & final package performance. The Chroma 58173-V provides an ultra-clean current source by taking advantage of Chroma's 52400 series 4-quardrant PXI Source Measurement Unit (SMU). This SMU offers 7 current force/measured ranges (200 mA max) with low noise & high accuracy to protect the VCSEL or other surface emitting laser diode. High slew-rate driver provides μs pulse to CW for various test applications.

Availability
The Chroma 58173-V Laser Diode Test System is available for order directly from Chroma ATE, Inc. by visiting their website, http://www.chromaus.com, or calling 1-800-478-2026 (1-949-421-0355).

About Chroma ATE
Founded in 1984, Chroma is a respected world leading manufacturer of complete Electronic Test and Measurement Solutions for commercial, automotive, military and government industries.  Utilizing in-house Automated Handling and Manufacturing Execution System (MES) expertise, Chroma specializes in integrated and fully automated turn-key electronic test and manufacturing solutions for green technologies including LED, solar cell / module and Electric Vehicle (EV) as well as battery formation, test & grading production solutions.  In the USA Chroma is headquartered in Irvine CA, with worldwide engineering service offices in the United States, Taiwan (corporate headquarters), Europe, China, and Japan.  For more information, visit Chroma’s website at http://www.chromaus.com.

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Chroma is a world leading own brand supplier in electronic test and measurement equipment and systems. Chroma provides integrated and customized turnkey solutions in test and measurement instruments, automatic testing and manufacturing execution systems.

Photo:
http://www.prlog.org/11781022/1

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Contact Email:
***@chromaus.com Email Verified
Source:Chroma ATE, Inc.
Phone:1-800-478-2026
Zip:92618
City/Town:Irvine - California - United States
Industry:Electronics, Engineering, Industrial
Tags:VCSEL, laser, laser diode, chroma, semiconductor, led, chip, PXI, smu, wavelength, integrated sphere, wafer, ate
Shortcut:prlog.org/11781022
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