XJTAG provides a ‘quantum leap’ in students’ understanding of boundary scan testing

- XJTAG Worldwide University Programme provides leading commercial-grade JTAG testing systems at special discounted price - SUPSI University of Applied Science benefits from XJTAG’s boundary scan solution
By: Katie Matthews
 
Jan. 10, 2012 - PRLog -- CAMBRIDGE, England, 10th January 2012 — XJTAG’s boundary scan technology has contributed to a “quantum leap” in the learning experience of students at SUPSI, The University of Applied Sciences of Southern Switzerland, according to Paolo Ceppi from the Department of Innovative Technologies.

The university, which prides itself on bridging the gap between scientific development, education and real world applications, is working with XJTAG through its Worldwide University Programme, in order to introduce students to commercial-grade IEEE 1149.X JTAG compliant boundary scan tools.

“XJTAG is now being used for both our practical demonstrations and laboratory exercises and has given our students a ‘quantum leap’ in their enhanced learning experience,” says Paolo. “To help develop local expertise on the technology, XJTAG is also supporting student projects. This professional approach from the company, with its swift and continuous support, is certainly appreciated.”

Paolo says that the university, which is using XJTAG as part of its microelectronic courses to teach students about boundary scan, was very impressed by the friendly user interface of XJTAG, with its easy set up and test, and clear test results.

The XJTAG development system is being used directly as a teaching resource and is supplied with demonstration hardware, tutorials, comprehensive documentation and online support. XJTAG can achieve a high level of test coverage on boards containing both JTAG and non-JTAG devices. FPGAs, SDRAMs, Ethernet controllers, video interfaces, Flash memories and microprocessors are some examples of the types of devices that can be tested. XJTAG is supplied with an extensive library that contains tests for thousands of devices. These tests are written in XJEase, a high level test description language that makes it easy to write or customise test routines. Tests are written from the device’s perspective and can be reused in any circuit without additional work.

SUPSI’s Department of Innovative Technologies is using XJTAG to teach students how to write and customise tests for boards containing microcontrollers, FPGAs, sensors and RF transceivers.

For more information, please contact Marketing Manager Katie Matthews on +44 (0)1223 223007, or email katie.matthews@xjtag.com.

Photography to accompany this news release is available at:

http://www.xjtag.com/images/press/10-01-12a.jpg

http://www.xjtag.com/images/press/10-01-12b.jpg

http://www.xjtag.com/images/press/10-01-12c.jpg


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Source:Katie Matthews
Email:***@xjtag.com Email Verified
Tags:Jtag, XJTAG, Boundary Scan, SUPSI-DTI, Worldwide University Programme, Debugging
Industry:Boundary Scan
Location:England
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