With the introduction of Version 1.1, ACS Basic Edition, a member of Keithley’s Automated Characterization Suite (ACS) family, can now support a far broader range of DC voltage and current test capabilities. It’s compatible with the company’s full SMU offering, the broadest array of choices in the industry. Depending on the SMU selected, ACS Basic Edition supports sourcing and measuring up to 5A or 1100V DC on individual channels. The newly expanded source and measure ranges are especially useful for tests on evolving photovoltaic panels/solar cells and high power electronics in research, failure analysis, and inspection applications. ACS Basic Edition now also supports combining different SMU models into a single test, allowing easier configuration, test creation, and test execution – with no need to write code.
Keithley developed ACS Basic Edition to maximize the productivity of technicians and engineers responsible for packaged part characterization in applications ranging from early device research through development, quality verification, and failure analysis. It is delivered complete with a library of pre-configured component test routines to minimize start-up time, reduce the need for code development, and simplify the component testing process. Even novice users can test a semiconductor component in seconds and compare the characteristic curves with reference curves immediately. Much like a traditional analog curve tracer, ACS Basic Edition can generate a family of curves on a packaged part quickly but also offers the flexibility to save, compare, and correlate results easily.
Version 1.1 of the package provides a variety of new and enhanced capabilities:
•Expanded hardware options: The software now supports combining hardware from any of Keithley’s SMU families into a single test, including Series 2600 and 2600A System SourceMeter instruments, Series 2400 SourceMeter instruments, the Model 4200-SCS Semiconductor Characterization System, and the Model 237 High-Voltage SMU. Now, users can test with a variety of SMU instrumentation optimized for a device’s specific current and voltage requirements.
A new communication settings window allows configuring a variety of external GPIB instrumentation, such as a switch matrix, capacitance-
• Test saving enhancements:
With this feature, users can organize their tests as they collect important data or update their test method.
• Updated test selection dialog: Enhancements to this dialog include a new GENERIC device option, an improved user-defined device function, and a new instrument models listbox that includes all the instruments scanned by the software at startup.
• Easier data visualization:
• Script editor enhancements:
Keithley Instruments, Inc., a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (I V), capacitance-
Price and Availability.
ACS Basic Edition Version 1.1 is now available and is priced at $4995.
For More Information.
For more information on ACS Basic Edition Version 1.1, visit www.keithley.com/
Telephone: 800-688-9951 / 440-248-0400
Address: Keithley Instruments, Inc.
28775 Aurora Road
Cleveland, OH 44139-1891
About Keithley Instruments, Inc.
With more than 60 years of measurement expertise, Keithley Instruments has become a world leader in advanced electrical test instruments and systems from DC to RF (radio frequency). Our customers are scientists and engineers in the worldwide electronics industry involved with advanced materials research, semiconductor device development and fabrication, and the production of end products such as portable wireless devices. The value we provide them is a combination of products for their critical measurement needs and a rich understanding of their applications to improve the quality of their products and reduce their cost of test.
Products and company names listed are trademarks or trade names of their respective companies.
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Keithley Instruments, Inc. designs, develops, manufactures & markets complex electronic instruments & systems geared to the specialized needs of electronics manufacturers for high-performance production testing, process monitoring, & product development.