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Microdynamics To Exhibit At Quality Expo

Microdynamics, Inc will be at booth # 4670 at the Quality Expo in Chicago on September 22-24. We will be introducing new products that will truly revolutionize the way you think about non-contact surface roughness measurement.

FOR IMMEDIATE RELEASE

PRLog (Press Release) - Aug 14, 2009 -
MicroDynamics, long the leader in cell volume measurement in the flexographic printing industry, will be introducing the MicroQC inspection microscope at Quality Expo. The MicroQC is a highly versatile, lightweight instrument that is extremely accurate with proven repeatable results.
The MicroDynamics QC line of inspection microscopes have a reputation for being durable and accurate in a production environment. Multiple gauge studies have shown their products to have repeatable accuracy of +/- 1%.
The new MicroQC continues this history of excellence while adding the additional benefits of being lightweight and adaptable to any QC and testing environment. Custom fixturing will allow the MicroQC to be combined with robotics for a truly automatic, hands free testing process.
John Bearden, MicroDynamics Technical Director, stated, "We are very excited about the possibilities the MicroQC opens up. Accurate, non-contact surface roughness measurement has now become easy and affordable to achieve."
Visit MicroDynamics at booth 4670 for a demonstration of their quality inspection instruments. They can be contacted at 770-924-2770 and Mr. Bearden can be reached at johnb@microdynamics.net

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MicroDynamics designs and manufactures precision interferometric microscopes with applications in the flexographic printing industry and QC applications for surface topography and roughness analysis

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Contact Email:
***@microdynamics.net Email Verified
Source:MicroDynamics
Phone:770-924-2770
Fax:770-924-3351
Address:712 Executive Court
:Woodstock, GA 30189
Zip:30101
State/Province:Georgia
Country:United States
Industry:Aerospace, Automotive, Manufacturing
Tags:surface roughness measurement, inspection microscopes, suface topography analysis 3d microscope
Last Updated:Aug 14, 2009
Shortcut:http://prlog.org/10310438
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