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DNV Certifies Spectrum Thin Films, Inc. to ISO 9001:2000

Hauppauge, NY August 20, 2008 - Det Norske Veritas Certification, Inc. is pleased to announce the ISO 9001:2000 certification of Spectrum Thin Films, Inc.

FOR IMMEDIATE RELEASE

 
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PRLog (Press Release) - Aug 20, 2008 -
Spectrum Thin Films is one of a few companies to meet the new ISO certification requirements.  By achieving ISO certification, Spectrum Thin Films, Inc. demonstrates its commitment to quality for the design and manufacture of high quality optics and optical coatings products for it U.S. Manufacturing operations.

In accepting the registration certificate Heide Nazario, director of quality assurance for Spectrum Thin Films, Inc. noted, “The achievement of ISO 9001:2000 reflects our continuous effort to achieve superior product quality and reliability for our current customer base and new client prospects.”

Spectrum Thin Films’ President Mr. Anthony Pirera added, “Because of our strong position in the industry, our products are well received by companies world wide.  This certification validates their confidence in us.  We are proud to have achieved this formal recognition.”  

Spectrum Thin Films was founded in 1993 by a well established leader in the Optics industry.  Areas of specialization are advanced manufacturing of thin film coatings and optics for science, medical, aerospace military and astronomy research.  Internally designed advanced coating systems utilizing Ion Beam assisted and Ion beam Sputtering for an unlimited variety  of applications from UV ~ Far IR.

Photo:
http://www.prlog.org/10107640/1

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Spectrum Thin Films was founded in 1993 by a well established leader in the Optics industry. Areas of specialization are advanced manufacturing of thin film coatings and optics for science, medical, aerospace military and astronomy research.

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Contact Email:
Source:Maria Pirera
Phone:631 901 1010
Fax:631 236 4039
Address:135 Marcus Blvd.
Zip:11788
City/Town:Hauppauge
State/Province:New York
Country:United States
Tags:, , , far ir, , ,
Last Updated:Aug 20, 2008
Shortcut:http://prlog.org/10107640
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